Kent A. Meyer

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home:									
764 S. Nyes Road							
Hummelstown, PA 17036							
(717) 599-4162 cell							
Email:  kameyer226b@yahoo.com
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Researcher with experience in the fields of physical and analytical 
chemistry, spectroscopy, imaging, and nanoscience, seeking research and
development and/or project management position

	• Multi-disciplinary research with pioneering background 
	• Two dozen publications with 2 cover articles
	• Academic, government, small industry experience
		
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  PROFESSIONAL EXPERIENCE	
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  Consultant							    2010-2016		  
  Comstock, Inc.,  Oak Ridge, TN
  • Software interfacing for mass spectrometers 
  • Prototyping and testing of field and laboratory mass spectometers 

  Junior Scientist						    2010
  Fairfield Service Group, Knoxville, TN
  • Computer modeling for process analytical instrumentation    

  Postdoctoral Research Associate		   	            2004-2009
  Oak Ridge Associated Universities, Oak Ridge, TN
  • Ultrafast laser research
  • Projects included pioneering nanoscale chemical imaging (quantum dots,
    nanowires, nanoplasmonics, tip enhanced spectroscopy), mass spectrometry,
    fiber optic thermometry, and photonics

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  EDUCATION
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  The University of Wisconsin-Madison, Madison, WI		    1998-2004
  Ph.D., Chemistry
  Dissertation:  "Frequency-scanned Ultrafast Spectroscopic Techniques Applied
  to Infrared Four-wave Mixing Spectroscopy"
  • Designed, built, and calibrated a multi-dimensional infrared ultrafast 
    laser system
  • Studied homogeneous catalyst 
  • Theoretical derivation
		
  The Pennsylvania State University, University Park, PA            1994-1998
  B.S., Chemistry
  Minor in Physics
  Cumulative GPA: 3.93/4.00, with high distinction (magna cum laude)
  • Developed and analyzed organic molecules  

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  SKILLS	
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  General:
  • LabVIEW, Matlab, C, HTML, Photoshop, data analysis/spreadsheets  
  • Metal machining and CAD 
  • Passive electronics, noise reduction, detectors
  • High vacuum 
  • Laser maintenance 
  • Inorganic and organic synthesis (sol gel, thin film, nanowire)
  
  Instrumentation:
  • Spectroscopy (FT-IR, Raman, spectrofluorimetry, UV-VIS, time resolved,
    non-linear)
  • Atomic force microscopy (AFM) and near-field scanning optical microscopy
    (NSOM)
  • Optical microscopy and imaging
  • Tabletop laser systems   
  • Scanning electron microscopy (SEM)
  • Time-of-flight, ion trap mass spectrometry