Kent A. Meyer -------------------------------------------------------------------------------- home: 2715 Mable Couch Way Knoxville, TN 37931 (865) 693-8551 (717) 599-4162 cell Email: meyerka@bellsouth.net -------------------------------------------------------------------------------- Researcher with experience in the fields of physical and analytical chemistry, spectroscopy, imaging, and nanoscience, seeking research and development and/or project management position • Multi-disciplinary experimental researcher • Two dozen publications with 2 cover articles • Extensive computational experience ----------------------------- PROFESSIONAL EXPERIENCE ----------------------------- Consultant 2010- Comstock, Inc., Oak Ridge, TN • Software interfacing for mass spectrometers Junior Scientist 2010 Fairfield Service Group, Knoxville, TN • Computer modeling for process analytical instrumentation Postdoctoral Research Associate 2004-2009 Oak Ridge Associated Universities, Oak Ridge, TN • Ultrafast laser research • Projects included fundamental nanoscale research (quantum dots, nanowires, nanoplasmonics, tip enhanced spectroscopy), mass spectrometry, fiber optic thermometry, and photonics ----------------------------- EDUCATION ----------------------------- The University of Wisconsin-Madison, Madison, WI 1998-2004 Ph.D., Chemistry Dissertation: "Frequency-scanned Ultrafast Spectroscopic Techniques Applied to Infrared Four-wave Mixing Spectroscopy" • Designed, built, and calibrated a multi-dimensional infrared ultrafast laser system • Studied homogeneous catalyst using non-linear spectroscopy • Independent work • Theoretical derivation The Pennsylvania State University, University Park, PA 1994-1998 B.S., Chemistry Minor in Physics Cumulative GPA: 3.93/4.00, with high distinction (magna cum laude) • Developed and analyzed organic molecules ----------------------------- SKILLS ----------------------------- General: • LabVIEW, Matlab, HTML, Photoshop, data analysis/spreadsheets • Metal machining and CAD • Passive electronics, noise reduction, detectors • Ultrahigh vacuum • Laser maintenance • Inorganic and organic synthesis (sol gel, thin film, nanowire) Instrumentation: • Spectroscopy (FT-IR, Raman, spectrofluorimetry, UV-VIS, time resolved, non-linear) • Atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM) • Optical microscopy and imaging • Tabletop laser systems • Scanning electron microscopy (SEM) • Time-of-flight, ion trap mass spectrometry ----------------------------- PUBLICATIONS (short list) ----------------------------- Meyer, K.A.; Polemi, A.; Shuford, K.L.; et al. Nanotechnology, 2010, 21, 415701. Meyer, K.A.; Ng, K.; et al. Appl. Spectrosc. 2010, 64, 1. Shuford, K.L.; Meyer, K.A.; et al. J. Phys. Chem. A 2009, 113, 4009. Bradshaw, J.A.; Ovchinnikova, O.; Meyer, K.A.; Goeringer, D.E. Rapid Comm. Mass Spec. 2009, 23, 3781. Meyer, K.A.; Ovchinnikova, O.; Ng, K..; Goeringer, D.E. Rev. Sci. Instrum. 2008, 77, 123710. Meyer, K.A.; Thompson, D.E.; Wright, J.C. J. Phys. Chem. A 2004, 108, 11485. Meyer, K.A.; Besemann, D.M.; Wright, J.C. Chem. Phys. Lett. 2003, 381, 642. ----------------------------- AFFILIATIONS ----------------------------- American Chemical Society Society for Applied Spectroscopy